I am currently a Ph.D. candidate in the Department of Industrial & Systems Engineering at Texas A&M (College Station, TX).  I received an M.S. in Management Science & Engineering (2002) and a B.S. in International Enterprise Management (2000) from Tianjin University, China.  I did an internship at Intel Corporation (Santa Clara, CA) in August, 2006.  I have finished my dissertation work and will graduate in August, 2008. 

  My research focuses on multi-scale/multi-resolution modeling and analysis and its applications in manufacturing, remote sensing, nanomanufacturing and bioinformatics. It addresses the problems: How do data of different scales and resolutions relate to each other?  Can we enhance decision making by using data of all scales and resolutions, instead of just single-scale/single-resolution data?  What are effective methods for using multi-scale/multi-resolution data? 

  I have developed some new methodologies for integrating multi-scale and multi-resolution data.  I have applied these new methods to integrate multi-resolution metrology data for dimensional quality control in manufacturing. The integrated analysis improves the prediction accuracy by more than 40% than methods using single-resolution data, and saves more than 90% of data collection time. 

  If you are interested in knowing me more, please refer to my Curriculum Vitae. Here is a short version: Resume.

My Plublications:

1. Xia, H., Ding, Y. and Wang, J. (2007) "Gaussian Process Method for Form Error Assessment Using Coordinate Measurements", accepted by IIE Transactions.

2. Xia, H., Ding, Y. and Mallick, B. (2007) “Bayesian Hierarchical Model for Integrating Multi-resolution Metrology Data," winner of the 2007 INFORMS "Quality, Statistics and Reliability" Best Student Paper Award, under revision for Technometrics.(QSR version, Technometrics version)

3. Xia, H., Wang, F., Mao, J. and Raulefs, P. "Bayesian Physics-Driven Statistical Model for Predicting Transistor Performance", to be submitted to IEEE Transactions on Semiconductor Manufacturing.

4. Xia, H., Huang, J. and Ding, Y. “Multi-resolution Modeling and Data Integration for Metrology Applications", to be submitted to The Annals of Applied Statistics.

5. Xia, H., Huang, J. and Ding, Y. “Error Analysis and Data Collection Strategy for Multi-resolution Data Integration", working paper.

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